Christopher Haster ef1c926940 Increased testing to include geometries that can't be fully tested ...

This is primarily to get better test coverage over devices with very
large erase/prog/read sizes. The unfortunate state of the tests is
that most of them rely on a specific block device size, so that
ENOSPC and ECORRUPT errors occur in specific situations.

This should be improved in the future, but at least for now we can
open up some of the simpler tests to run on these different
configurations.

Also added testing over both 0x00 and 0xff erase values in emubd.

Also added a number of small file tests that expose issues prevalent
on NAND devices.

2019-07-26 19:50:17 -05:00

7.9 KiB

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